Patent · US Active

Depth queue by thermal sensing

US10743389B2 · kind B2 · utility

0Cited by
5References
9Claims
0Family size

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Key dates

Filing dateSep 18, 2017
Grant dateAug 11, 2020
Priority date
Expiry dateSep 18, 2037

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02B20/40
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method (300) for characterizing a lighting environment using thermal imaging includes the steps of: providing (310) a lighting unit (10) comprising a light source (12), a thermal imager (32), and a controller (22); obtaining (330), using the thermal imager, one or more thermal images of one or more surfaces (52) within the lighting environment; extracting (340), by the controller using the one or more thermal images, a thermal shadow (54) on one or more surfaces within the lighting environment; determining (360), from the thermal shadow, a depth queue for an object (52) associated with the thermal shadow; and characterizing (370), by the controller using the determined depth queue, the object.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.