Misalignment detection for a 3D printing device
US10744714B2 · kind B2 · utility
13Cited by
10References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 30, 2015 |
| Grant date | Aug 18, 2020 |
| Priority date | — |
| Expiry date | Oct 26, 2035 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB29C64/106
- WIPO fieldOther special machines
- WIPO sectorMechanical engineering
Abstract
Misalignments of a 3d printing device may be detected by providing a reference pattern in a print zone of the 3d printing device, wherein the reference pattern comprises a plurality of reference marks, printing a test pattern on the reference pattern by means of the 3d printing device, and comparing the test pattern with the reference marks.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.