Methods and apparatus for classifying an artifact in a specimen
US10746665B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 24, 2017 |
| Grant date | Aug 18, 2020 |
| Priority date | — |
| Expiry date | Jun 22, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30168
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A model-based method of inspecting a specimen for presence of one or more artifacts (e.g., a clot, bubble, and/or foam). The method includes capturing multiple images of the specimen at multiple different exposures and at multiple spectra having different nominal wavelengths, selection of optimally-exposed pixels from the captured images to generate optimally-exposed image data for each spectra, computing statistics of the optimally-exposed pixels to generate statistical data, identifying a serum or plasma portion of the specimen, and classifying, based on the statistical data, whether an artifact is present or absent within the serum or plasma portion. Testing apparatus and quality check modules adapted to carry out the method are described, as are other aspects.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.