Patent · US Active

Imaging system and method with scatter correction

US10746671B2 · kind B2 · utility

1Cited by

5References

23Claims

0Family size

Assignee

GE Sensing & Inspection Technologies GmbH · DE

Inventors

Alexander Suppes · Garbsen, DE
Nils Rothe · Hürth, DE

Key dates

Filing date	Mar 6, 2015
Grant date	Aug 18, 2020
Priority date	—
Expiry date	May 4, 2035

Classification

Technology area (CPC G)Physics
CPC primaryG01N2223/419
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for imaging an object is presented. The method includes acquiring a first projection image of the object using a source and a detector, positioning a scatter rejecting aperture plate between the object and the detector, and acquiring a second projection image of the object with the scatter rejecting aperture plate disposed between the object and the detector. A scatter image of the object is generated based on the first projection image and the second projection image, and stored for subsequent imaging. A volumetric CT system for imaging an object is also presented. The system is configured to acquire a plurality of projection images of the object from a plurality of plurality of projection angles.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.