Patent · US Active

Test device and method for operating a test device

US10746813B2 · kind B2 · utility

0Cited by

9References

30Claims

0Family size

Assignee

Omicron electronics GmbH · AT

Inventors

Reinhard Kaufmann · Thüringerberg, AT
Dirk Flax · Dornbirn, AT

Key dates

Filing date	May 20, 2016
Grant date	Aug 18, 2020
Priority date	—
Expiry date	Aug 29, 2036

Classification

Technology area (CPC H)Electricity
CPC primaryH02P13/00
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A test device is configured for testing a specimen which has an inductor. The test device includes a controllable unit for reducing a current intensity of a current flowing in the inductor.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.