Calibration of microscopy systems
US10746980B2 · kind B2 · utility
4Cited by
7References
25Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 6, 2015 |
| Grant date | Aug 18, 2020 |
| Priority date | — |
| Expiry date | Sep 7, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/615
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Approaches are disclosed for calibrating a plurality of imaging devices, such as microscopes. In certain implementations, a calibration plate is employed that includes a variety of calibration features. The calibration features comprise a geometric calibration, an illumination calibration, and an optical calibration. Imaging devices calibrated in accordance with the present approaches may be used to generate images having consistent attributes, such as brightness, regardless of which imaging device is employed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.