Test device and test method
US10749783B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jan 27, 2017 |
| Grant date | Aug 18, 2020 |
| Priority date | — |
| Expiry date | Nov 13, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L43/50
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
The present invention provides a test device for analyzing data communication of an electronic device, the test device comprising a data encoder configured to encode outgoing data according to a predefined physical protocol and output a respective outgoing physical signal to the electronic device, a data analyzer configured to receive an incoming physical signal from the electronic device and provide incoming data encoded in the incoming physical signal, a protocol emulator that is coupled to the data encoder and the data analyzer and that is configured to generate the outgoing data and decode the incoming data according to a predetermined application protocol, and a protocol analyzer that is coupled to the protocol emulator and that is configured to analyze a protocol conformance of the incoming data to the predefined application protocol. Further, the present invention provides a respective test method.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.