Contact force testing apparatus, use of such a contact force testing apparatus and method for producing such a contact force testing apparatus

US10753809B2 · kind B2 · utility

Assignee

• Kistler Holding AG · CH

Inventors

• Giovanni Mastrogiacomo · Zürich, CH
• Sandro Brandenberger · Andelfingen, CH
• Paul Furter · Illnau, CH
• Reinhard Staub · Herrliberg, CH
• Rolf Thiel · Winterthur, CH
• Claudio Cavalloni · Regensdorf, CH

Key dates

• Filing date: Apr 22, 2016
• Grant date: Aug 25, 2020
• Expiry date: Jun 20, 2037

Classification

• Technology area (CPC G): Physics
• CPC primary: G01L1/18
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A contact force testing apparatus includes a measuring sensor that can be contacted with an electrical contact element and measures a contact force (F) of a contact with the electrical contact element. The measuring sensor includes piezoelectric material that receives the contact force (F) in a contact region and produces polarization charges. The measuring sensor includes an acceptor electrode that is completely surrounded by piezoelectric material in the contact region in the direction of a thickness extension of the measuring sensor and receives the polarization charges. A method is provided for the use of such a contact force testing apparatus, and a method is provided for producing such a contact force testing apparatus.