Suspended particle characterization system
US10753849B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 13, 2015 |
| Grant date | Aug 25, 2020 |
| Priority date | — |
| Expiry date | Jul 14, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/651
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus (10) for characterizing particles, comprising: a microscope objective with an optical axis and a depth of field; a holder cell (22) configured to position the particles in a generally planar volume below the microscope objective, the planar volume being substantially normal to the optical axis and having a depth that is less than or equal to the depth of field, wherein a portion of the cell holder (22) for positioning in the optical axis of the microscope objective is substantially free of significant spectral features in a Raman spectral range; an x-y stage (20) to move the microscope objective relative to the holder cell (22) in x and y directions to align particles with the optical axis of the microscope objective while the particles are held by the holder cell (22), a detector (18) for acquiring an image of a particle through the microscope objective, a laser operable to illuminate a particle held by the holder cell (22), a Raman spectrometer (16) arranged to obtain a spectrum including the Raman spectral range from the illuminated particle, and characterizing logic operative to characterize the particle based on image processing operations performed on the acquire…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.