Methods and systems for predicting failures in X-ray tubes
US10753969B2 · kind B2 · utility
2Cited by
7References
18Claims
0Family size
Assignee
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Key dates
| Filing date | Apr 13, 2018 |
| Grant date | Aug 25, 2020 |
| Priority date | — |
| Expiry date | Dec 6, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J35/025
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
The present approach relates to generating one or both of a failure prediction indication for an X-ray tube or a remaining useful life estimate for the X-ray tube. In one implementation, a trained static tube model is used in estimating health (e.g., thickness) of the electron emitter of the X-ray tube, which in turn may be used in predicting remaining useful life of an electron emitter of the X-ray tube.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.