Window defect sensing and image processing
US10755123B1 · kind B1 · utility
5Cited by
1References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 15, 2018 |
| Grant date | Aug 25, 2020 |
| Priority date | — |
| Expiry date | Jun 16, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N23/90
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Various embodiments relate to sensing defects associated with a window. Furthermore, various embodiments relate to performing image processing to produce a corrected image of a scene based at least partly on data corresponding to the detected defects. In some examples, one or more lighting modules may be used to illuminate the window to facilitate detection of the defects by one or more sensor devices.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.