Storage device and methods with fault tolerance capability for neural networks
US10755772B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 1, 2019 |
| Grant date | Aug 25, 2020 |
| Priority date | — |
| Expiry date | Aug 1, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/028
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Aspect for storage device with fault tolerance capability for neural networks are described herein. The aspects may include a first storage unit of a storage device. The first storage unit is configured to store one or more first bits of data and the data includes floating point type data and fixed point type data. The first bits include one or more sign bits of the floating point type data and the fixed point type data. The aspect may further include a second storage unit of the storage device. The second storage unit may be configured to store one or more second bits of the data. In some examples, the first storage unit may include an ECC memory and the second storage unit may include a non-ECC memory. The ECC memory may include an ECC check Dynamic Random Access Memory and an ECC check Static Random Access Memory.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.