Method for testing retinal implant
US10760961B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 16, 2017 |
| Grant date | Sep 1, 2020 |
| Priority date | — |
| Expiry date | Mar 7, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2001/444
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to a method for testing a retinal implant. After an implantable device for interfacing with retinal cells is provided, an external stimulus is applied to the implantable device so that the implantable device transmits a first pulse to a processing device through a wireless interface. When a conversion unit is controlled to gradually decrease an output voltage until the implantable device outputs an output voltage lower than a reference voltage, the implantable device transmits a signal different from the first pulse to the processing device through the wireless interface. The processing device determines a current value of a pixel unit according to a time difference between the first pulse and the signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.