Method for evaluating positioning parameters and system

US10761200B1 · kind B1 · utility

Assignee

• OSRAM GmbH · DE

Inventors

• Michael Eschey · Wehringen, DE
• Helmi Abidi · Munich, DE

Key dates

• Filing date: Feb 26, 2020
• Grant date: Sep 1, 2020
• Expiry date: Feb 26, 2040

Classification

• Technology area (CPC G): Physics
• CPC primary: G01S2205/02
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method for evaluating positioning parameters in a defined area, wherein the defined area is affected by at least three stationary access beam points and over which a grid pattern is laid with at least two grids, each grid having an anchor. An initial vector of positioning parameters is assigned to each anchor and a plurality of RSSI measurements are captured within the defined area by receiving signals from the at least three stationary access beam points. The plurality of RSSI measurement are clustered in a plurality of subsets, wherein the number of subsets corresponds to the number of the at least two grids. Finally, each subset of the plurality of subsets is associated with a respective one of the at least two grids and the initial vector is updated based on the subset of the plurality of subsets associated with the respective one of the at least two grids.