Cognitive manufacturing systems test repair action
US10761974B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 10, 2017 |
| Grant date | Sep 1, 2020 |
| Priority date | — |
| Expiry date | Jun 8, 2038 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P90/02
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Embodiments of the present invention provide a computer-implemented method for generating test plans based on test failure root causes or symptoms. The method generates a heat map of manufacturing process test failures based at least in part on historical test failures and prior repair actions. A database is searched for test failure records that are relevant to user input. Relevant test failure records are prioritized via an index score that is assigned based at least in part on proximity of the relevant test failure records to the user input. Failure records that have an index score that is higher than a threshold value are detected. Unstructured text data of each of the detected failure records is analyzed to identify relevant keywords and relevancy rates. A test solution priority list is displayed, via a GUI, in a window or view that is separate from the heat map.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.