Patent · US Active

Chemical mechanical polishing slurry composition for polishing polycrystalline silicon film

US10767081B2 · kind B2 · utility

0Cited by
0References
9Claims
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Inventors

Key dates

Filing dateNov 15, 2018
Grant dateSep 8, 2020
Priority date
Expiry dateNov 15, 2038

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/31053
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A chemical mechanical polishing slurry composition for polishing a polycrystalline silicon film is presented, comprising: a solvent; a polishing agent; a pH adjuster; and at least one additive selected from the group consisting of a compound represented by Chemical Formula 1 below, a compound represented by Chemical Formula 2 below, and a tautomer thereof.The chemical mechanical polishing slurry composition for polishing a polycrystalline silicon film exhibits a high polishing speed and has various polishing selectivities when employed in a process for polishing a polycrystalline silicon film of a semiconductor wafer, and thus the composition may be effectively used as a composition for a process for polishing a polycrystalline silicon surface for the formation of highly integrated multilayer structured devices.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.