Loop-back probe test and verification method

US10768206B2 · kind B2 · utility

Assignee

• Integrated Technology Corporation · US

Inventors

• Rodney E. Schwartz · La Marque, US
• John K. Geist · Cedar Rapids, US
• Daniel Kosecki · Mesa, US

Key dates

• Filing date: Jun 21, 2016
• Grant date: Sep 8, 2020
• Expiry date: Nov 21, 2037

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/2891
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method is provided for using a loop-back test device to verify continuity between loop-back probes electrically connected to each other on a probe card, the loop-back test device including a first conductive region electrically connected to a substrate, a second conductive region electrically isolated from the substrate, the second conductive region spaced apart from the first conductive region such that when a first loop-back probe contacts the first conductive region a second loop-back probe contacts the second conductive region, The method includes placing the first loop-back probe in electrical contact with the first conductive region, and placing the second loop-back probe in electrical contact with the second conductive region. Continuity between the substrate and the second conductive region is then measured.