Method for using a geometrical probe with a spindle of a machine tool, and machine tool configured to carry out such a method
US10768604B2 · kind B2 · utility
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2References
14Claims
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Key dates
| Filing date | Aug 13, 2018 |
| Grant date | Sep 8, 2020 |
| Priority date | — |
| Expiry date | Oct 11, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/37428
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A method for using a geometrical probe (5) with a spindle (3) of a machine tool (1), wherein a probe fetch waiting state of the machine tool (1), at least one temperature parameter related to a temperature of the spindle (3) of the machine tool (1) is determined by measuring at least one temperature value for the spindle (3), and time for fetching the geometrical probe (5) is determined depending on the at least one temperature parameter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.