Patent · US Active

Method for using a geometrical probe with a spindle of a machine tool, and machine tool configured to carry out such a method

US10768604B2 · kind B2 · utility

0Cited by
2References
14Claims
0Family size

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Key dates

Filing dateAug 13, 2018
Grant dateSep 8, 2020
Priority date
Expiry dateOct 11, 2038

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG05B2219/37428
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

A method for using a geometrical probe (5) with a spindle (3) of a machine tool (1), wherein a probe fetch waiting state of the machine tool (1), at least one temperature parameter related to a temperature of the spindle (3) of the machine tool (1) is determined by measuring at least one temperature value for the spindle (3), and time for fetching the geometrical probe (5) is determined depending on the at least one temperature parameter.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.