Batch automatic test method for solid state disks and batch automatic test device for solid state disks
US10768852B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Feb 28, 2019 |
| Grant date | Sep 8, 2020 |
| Priority date | — |
| Expiry date | Feb 28, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F3/0679
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A batch automatic test method and a batch automatic test device for solid state disks are provided. The batch automatic test method is used for testing a plurality of solid state disks by a batch automatic test device. The solid state disks are coupled to the batch automatic test device. The batch automatic test method includes the following steps. A plurality of buses of the batch automatic test device are scanned to mark the solid state disks and a system disk. A piece of disk information of each of the solid state disks is shown. Each of the pieces of the disk information includes a disk location of each of the solid state disks. A formatting procedure is synchronously performed on the solid state disks according to the disk locations. After performing the formatting procedure, a burn-in test procedure is automatically and synchronously performed on the solid state disks.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.