Systems and methods for selectively instrumenting a program according to performance characteristics
US10768915B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 18, 2018 |
| Grant date | Sep 8, 2020 |
| Priority date | — |
| Expiry date | Nov 4, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2221/033
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
System, methods, and other embodiments described herein relate to determining performance overhead for instrumentation within a program. In one embodiment, a method includes, in response to compiling the program from source code into machine code, analyzing the program to generate overhead scores associated with segments of instrumentation within separate functions of the program. The instrumentation is combined with the source code to provide functionality in addition to a base functionality of the program. The method includes selectively modifying the segments in the source code for the separate functions according to whether the overhead scores for respective ones of the segments satisfies an instrumentation threshold associated with respective ones of the separate functions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.