Automated parameterization image pattern recognition method
US10769432B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 10, 2018 |
| Grant date | Sep 8, 2020 |
| Priority date | — |
| Expiry date | Mar 7, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2218/12
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A computerized automated parameterization image pattern detection and classification method performs (1) morphological metrics learning using labeled region data to generate morphological metrics; (2) intensity metrics learning using learning image and labeled region data to generate intensity metrics; and (3) population learning using the morphological metrics and the intensity metrics to generate learned pattern detection parameter. The method may further update the learned pattern detection parameter using additional labeled region data and learning image, and apply pattern detection with optional user parameter adjustment to image data to generate detected pattern. The method may alternatively perform pixel parameter learning and pixel classification to generate pixel class confidence, and uses the pixel class confidence and the labeled region data to perform pattern parameter learning to generate the learned pattern detection parameter. The method may further perform pattern classification learning to generate pattern classifier which is used to generate classified pattern.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.