Patent · US Active

Image analyzing method and electrical device

US10769784B2 · kind B2 · utility

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4Claims
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Assignee

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Key dates

Filing dateDec 21, 2018
Grant dateSep 8, 2020
Priority date
Expiry dateFeb 25, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/30024
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An image analyzing method is provided and includes: extracting a first feature vector according to global information of a digital image; dividing the digital image into multiple regions, and inputting each region into a convolutional neural network to obtain a second feature vector; merging the first feature vector with the second feature vectors to obtain a third feature vector; and performing an image analyzing process according to the third feature vector.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.