Circuit alteration detection in integrated circuits
US10770410B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 3, 2018 |
| Grant date | Sep 8, 2020 |
| Priority date | — |
| Expiry date | Aug 6, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L23/522
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A system with circuit alteration detection can include a shield in at least one metal layer over an integrated circuit, and a detector coupled to the shield to detect a change in impedance characteristics of one or more shield lines of the shield due to physical alteration of the shield. The shield lines can be arranged in one or more metal layers and cover an area with shape arrangements such as parallel lines and serpentines. The detector can include one or more comparators to detect a difference in impedance of more than a tolerance value. An appropriate countermeasure response can be initiated upon detection of the difference in impedance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.