Patent · US Active

Measuring device, calibration method and measuring method with jitter compensation

US10771076B1 · kind B1 · utility

1Cited by

9References

20Claims

0Family size

Assignee

Rohde & Schwarz GmbH & Co. KG · DE

Inventors

Gregor Feldhaus · Munich, DE
Alexander Roth · Griesheim, DE

Key dates

Filing date	Mar 27, 2019
Grant date	Sep 8, 2020
Priority date	—
Expiry date	Mar 27, 2039

Classification

Technology area (CPC H)Electricity
CPC primaryH04L7/033
WIPO fieldBasic communication processes
WIPO sectorElectrical engineering

Abstract

A measuring device with jitter compensation is provided. The measuring device including at least one analog-to-digital converter, a clock source, and at least one phase shifter. In this context, the at least one phase shifter is configured to receive a clock signal from the clock source and to adjust the respective phase.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.