Patent · US Active

Learning based incident or defect resolution, and test generation

US10771314B2 · kind B2 · utility

7Cited by

1References

20Claims

0Family size

Assignee

ACCENTURE GLOBAL SOLUTIONS LIMITED · IE

Inventors

Janardan Misra · Pithoragarh, IN
Divya Rawat · Dehradun, IN
Shubhashis Sengupta · Bengaluru, IN

Key dates

Filing date	Sep 13, 2018
Grant date	Sep 8, 2020
Priority date	—
Expiry date	Feb 9, 2039

Classification

Technology area (CPC H)Electricity
CPC primaryH04L43/50
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

In some examples, learning based incident or defect resolution, and test generation may include ascertaining historical log data that includes incident or defect log data associated with operation of a process, and generating, based on the historical log data, step action graphs. Based on grouping of the step action graphs with respect to different incident and defect tickets, an incident and defect action graph may be generated to further generate a machine learning model. Based on an analysis of the machine learning model with respect to a new incident or defect, an output that includes a sequence of actions may be generated to reproduce, for the new incident, steps that result in the new incident, reproduce, for the new defect, an error that results in the new defect, identify a root cause of the new incident or defect, and/or resolve the new incident or defect.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.