Instrumental analysis systems and methods
US10775285B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 13, 2017 |
| Grant date | Sep 15, 2020 |
| Priority date | — |
| Expiry date | Oct 3, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2035/00445
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Instrumental analysis systems are provided that can include: an analytical attachment axially aligned with a sample upon a sample stage; structure supporting both the attachment and the sample stage; and at least one band affixed to the analytical attachment and aligned symmetrically about the axis of the attachment. Methods for analyzing samples are provided. The methods can include: providing at least one band supported by a structure; firmly affixing an analytical attachment to the band, and axially aligning the attachment with a sample; and providing a temperature gradient between the band and the sample while maintaining axial alignment of the objective and the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.