System and device for automatic signal measurement
US10775428B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 26, 2018 |
| Grant date | Sep 15, 2020 |
| Priority date | — |
| Expiry date | Feb 28, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3031
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The system for automatic signal measurement includes a device under test, a control circuit, a data processing circuit, and a display device. The device under test includes a test pad area, which has multiple exposed test pads coupled to multiple circuit nodes in the device under test. The control circuit is coupled to the exposed test pads through a clamping fixture. The control circuit receives multiple test signals from the exposed test pads, stores multiple test signals in the memory, and controls a power on/off operation applied to the device under test through the exposed test pads. The data processing circuit is configured to receive the test signals stored in the memory, and determine whether the test signals meet a set of predetermined criteria to generate a verification result. The display device displays a signal waveform of the test signals and the verification result.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.