Programmable test instrument
US10776233B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 28, 2011 |
| Grant date | Sep 15, 2020 |
| Priority date | — |
| Expiry date | Nov 22, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/263
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In general, a test instrument includes a first processing system that is programmable to run one or more test programs to test a device interfaced to a test instrument, and that is programmed to control operation of the test instrument, and a second processing system that is dedicated to device testing. The second processing system being programmable to run one or more test programs to test the device, and the first processing system has a first application programming interface (API) and the second processing system has a second API, the first API and the second API being different APIs, the first API and the second API having at least some duplicate functions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.