Dimension measurement device, dimension measurement system, and dimension measurement method
US10776945B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 19, 2016 |
| Grant date | Sep 15, 2020 |
| Priority date | — |
| Expiry date | Jul 19, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N2013/0081
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Provided are a reference scale and dimension measurement system that make it possible to maintain accurate measurement even if the reference scale is not disposed or projected on a measurement surface. A dimension measurement device according to the present invention is provided with: a reference scale extraction means for extracting, from photographed image data including a reference scale that includes a film that has a pattern for displaying a length reference formed on the surface thereof and a lens that is in contact with the film, an image in which an image of the length reference is formed on the basis of the relationship between a pattern function expressing the length reference projected onto the lens according to variation in a prescribed angle between the reference scale and the optical axis of a photography device and an image formation color function indicating the image of the length reference formed on the imaging device; an object of measurement extraction means for extracting an object of measurement image from photographed image data including the reference scale; and a dimension calculation means for calculating a dimension of the object of measurement on the bas…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.