Method for identification of candidate points as possible characteristic points of a calibration pattern within an image of the calibration pattern
US10776953B2 · kind B2 · utility
7Cited by
8References
20Claims
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Key dates
| Filing date | Nov 17, 2016 |
| Grant date | Sep 15, 2020 |
| Priority date | — |
| Expiry date | Feb 10, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30208
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for identification of candidate points as possible characteristic points of a calibration pattern within an image of the calibration pattern includes the steps of determining spots within a filtered image de-rived from the image of the calibration pattern, with a spot being defined as a coherent set of pixels of the filtered image having pixel values exceeding a threshold; for each determined spot, calculating a central point of the determined spot; and identifying as candidate points all calculated central points.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.