Patent · US Active

System and method for determining a particle contamination

US10782221B2 · kind B2 · utility

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15Claims
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Key dates

Filing dateOct 21, 2019
Grant dateSep 22, 2020
Priority date
Expiry dateOct 21, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2015/0046
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A system for determining a particle contamination and a method for determining a particle contamination in a measurement environment is provided in which individual particles in the measurement environment are detected (S1), wherein a) an estimate of the number of particles per volume in the measurement environment is ascertained (S2), b) an estimate of the number of particles per volume and characterization information describing the particle source in the measurement information are taken as a basis for ascertaining an output value for the particle contamination in the measurement environment (S3), and c) context-related data are made available and the characterization information is estimated on the basis of the available context-related data (S4). The estimation of the characterization information on the basis of the available context-related data avoids the conventional restriction of the evaluable characterization information to firmly prescribed information and instead provides flexible adaptation of the characterization information to be evaluated to the context-related data.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.