Contact probe
US10782317B2 · kind B2 · utility
0Cited by
6References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 25, 2018 |
| Grant date | Sep 22, 2020 |
| Priority date | — |
| Expiry date | Aug 6, 2038 |
Classification
- Technology area (CPC C)Chemistry; Metallurgy
- CPC primaryC25D3/562
- WIPO fieldSurface technology, coating
- WIPO sectorChemistry
Abstract
Provided is a contact probe which may achieve improved heat resistance even when a spring portion thereof is compressed and released in a high temperature environment. The contact probe includes an Ni—P layer, and the Ni—P layer has different concentrations of P at different positions in a thickness direction of the Ni—P layer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.