Multiple three-dimensional (3-D) inspection renderings
US10782441B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 25, 2017 |
| Grant date | Sep 22, 2020 |
| Priority date | — |
| Expiry date | Apr 25, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2219/028
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An X-ray inspection system includes at least one display monitor and a console. The console includes at least two different visualization algorithms and a processor. The processor is configured to process volumetric image data with a first of the at least two different visualization algorithms and produce a first processed volumetric image. The processor is further configured to process the volumetric image data with a second of the at least two different visualization algorithms and produce a second processed volumetric image. The processor is further configured to concurrently display the first and second processed volumetric image data via the display monitor. The volumetric image data is indicative of a scanned object and items therein.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.