Systems and methods for calibrating a structured illumination imaging system and for capturing a structured illumination image
US10782514B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 29, 2017 |
| Grant date | Sep 22, 2020 |
| Priority date | — |
| Expiry date | Jan 12, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/0044
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for calibrating an imaging system can include at least the following method acts: illuminating a sample through a pinhole mask using an excitation light; capturing an image of the sample using a sensor; converting the image into data; in a processing module: filtering the data using a known spacing of pinholes in the pinhole mask to obtain filtered data that corresponds to the known spacing, using a threshold to identify regions of the filtered data that are bright enough to be associated with a pinhole, calculating the centroids of the regions, and fitting a known pattern for the pinhole mask to the regions in order to identify the best fit data for the filtered data; and storing, in a storage medium, the best fit data for use in a subsequent confocal capture routine.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.