Patent · US Active

Feedback-directed static analysis

US10783245B2 · kind B2 · utility

1Cited by
2References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 30, 2018
Grant dateSep 22, 2020
Priority date
Expiry dateFeb 26, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F2221/033
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method may include obtaining a list of to-be-analyzed modules of an application. The list of to-be-analyzed modules may include a first module including a statement. The method may further include generating initial results by performing an initial iteration of a static analysis that analyzes each module in the list of to-be-analyzed modules, determining, by the initial iteration, that the statement is a function call to a second module not in the list of to-be-analyzed modules, in response to the determination, assigning, by the initial iteration, an abstract value to a memory address associated with the statement, adding, to the abstract value, a tag including a name of the second module, updating, using the tag and the initial results, the list of to-be-analyzed modules, and generating next results by performing a next iteration of the static analysis that analyzes each module in the updated list of to-be-analyzed modules.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.