Simulation methods and systems for predicting SER
US10783306B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 10, 2017 |
| Grant date | Sep 22, 2020 |
| Priority date | — |
| Expiry date | May 8, 2038 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D62/119
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A soft error rate (SER) associated with a design of a semiconductor circuit may be predicted based on implementing a simulation associated with the design. The simulation may include generating a simulation environment based on information indicating the design, performing a particle strike simulation based on the simulation environment to generate charge deposition information, and calculating a collected charge quantity from the charge deposition information. A determination may be made whether the SER predicted based on the collected charge quantity at least meets a threshold. The design may be modified, and the simulation repeated, if the predicted SER value meets a threshold value. A semiconductor circuit may be manufactured based on the design if the predicted SER value is less than the threshold value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.