Patent · US Active

Hole location targets and measurement systems, and methods for measuring a location of a hole

US10783659B1 · kind B1 · utility

3Cited by
1References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 28, 2019
Grant dateSep 22, 2020
Priority date
Expiry dateJun 28, 2039

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/30204
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A hole location target includes a self-centering insert having a centerline and an optical target attached to the self-centering insert at a fixed position relative to the centerline of the self-centering insert. The optical target includes a light-emitting display. The light-emitting display includes a two-dimensional pattern thereon.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.