Object position independent method to measure the thickness of coatings deposited on curved objects moving at high rates
US10788314B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 4, 2017 |
| Grant date | Sep 29, 2020 |
| Priority date | — |
| Expiry date | Jan 4, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/8427
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and apparatus for measuring a thickness of a coating on an moving object are provided. Light is directed toward the object at a predetermined location on the object such that a portion of the light interacts with the object. A I D and/or 2D maximum intensities for at least one wavelength channel is captured that is produced by the portion of the light interacting with the object. A measured average intensity of the wavelength channel and/or intensities and their arithmetic derivatives of multi wavelength channel geometries is converted into I D (averaged) and/or 2D thickness values. Based on these values an acceptability of the coating is evaluated and thickness calculated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.