Method for estimating the intensity of a wave emitted by an emitting source
US10788417B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Feb 13, 2018 |
| Grant date | Sep 29, 2020 |
| Priority date | — |
| Expiry date | Feb 13, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/06186
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for analyzing a gaseous sample, by comparing an incident light wave and a transmitted light wave, the method comprising: i) illuminating the sample with a light source emitting the incident light wave propagating up to the sample; ii) detecting a light wave transmitted by the sample; iii) detecting a reference light wave emitted by the light source and representing a light wave reaching a reference photodetector without interacting with the sample; iv) repeating i) to iii) at different measurement instants; v) estimating, at each measurement instant, an intensity of the reference light wave; vi) taking into account the estimated intensity of the reference light wave and the detected intensity of the transmitted light wave to perform a comparison, at each measurement instant; and vii) analyzing the gaseous sample as a function of the comparison.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.