Method and device for identifying defect opening profile

US10788454B2 · kind B2 · utility

Assignees

• Hubei University of Technology · CN
• TSINGHUA UNIVERSITY · CN

Inventors

• Songling Huang · Beijing, CN
• Xiaochun SONG · Beijing, CN
• Lisha Peng · Beijing, CN
• Wei Zhao · Zhuhai, CN
• Shen-Ping Wang · Keelung, TW
• Xinjie Yu · Beijing, CN
• Shisong LI · Beijing, CN

Key dates

• Filing date: Jul 25, 2018
• Grant date: Sep 29, 2020
• Expiry date: Mar 7, 2039

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N27/83
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method for identifying a defect opening profile includes: acquiring a vertical component of a magnetic flux leakage signal of a defect; identifying right-angle features and corresponding right-angle position points of the defect from the vertical component; obtaining all possible right-angle types at each right-angle position point of the defect according to the corresponding right-angle feature of the vertical component; traversing all the possible right-angle types at each right-angle position point to determine respective optimal right-angle type at each right-angle position point; and drawing the defect opening profile according to the respective optimal right-angle type at each right-angle position point.