Dual function non-destructive inspection apparatus and method
US10788462B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 29, 2018 |
| Grant date | Sep 29, 2020 |
| Priority date | — |
| Expiry date | Mar 16, 2039 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/2694
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A dual function non-destructive inspection apparatus comprises a frame structure, a thermographic inspection system, a displacement system, and an ultrasonic inspection system. The frame structure has a channel, a first end, and a second end. The channel extends through the frame structure from the first end to the second end. The thermographic inspection system is associated with the first end of the frame structure. The displacement system is connected to the second end of the frame structure. The ultrasonic inspection system is connected to the displacement system such that the displacement system moves the ultrasonic inspection system relative to the channel of the frame structure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.