Apparatus and method for detecting reflection
US10789714B2 · kind B2 · utility
2Cited by
15References
20Claims
0Family size
Assignee
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Key dates
| Filing date | Jul 11, 2018 |
| Grant date | Sep 29, 2020 |
| Priority date | — |
| Expiry date | Nov 29, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V20/59
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and apparatus for detecting a reflection are provided. The method includes acquiring an input image of an object, based on an activation of an infrared light source, acquiring a reference image of the object, based on a deactivation of the infrared light source, and extracting a reflection region from the input image, based on the input image and the reference image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.