Systems, methods, and structures for optical phased array calibration via interference
US10790585B2 · kind B2 · utility
3Cited by
8References
25Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 19, 2019 |
| Grant date | Sep 29, 2020 |
| Priority date | — |
| Expiry date | Feb 27, 2039 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B10/25753
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
Aspects of the present disclosure describe systems, methods, and structures for optical phased array calibration that advantageously may be performed as a single-pass measurement of phase offset with respect to only a single interference measurement. In sharp contrast to the prior art—systems, methods, and structures according to aspects of the present disclosure advantageously produce phase offsets and phase functions of each element without time-consuming iterative procedures or multiple detector signals as required by the prior art.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.