Thin bed tuning frequency and thickness estimation
US10795040B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 13, 2016 |
| Grant date | Oct 6, 2020 |
| Priority date | — |
| Expiry date | Dec 20, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V2210/64
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method, apparatus, and program product analyze time-series data such as seismic data collected from a subsurface formation by splitting a time-series data set such as an individual seismic trace into a plurality of spectral components, each having an associated frequency, determining an instantaneous frequency for each spectral component, determining a frequency difference for each spectral component based at least in part on the associated and instantaneous frequencies therefor, and determining a tuning parameter based at least in part on the determined frequency difference of each spectral component. Doing so enables, for example, thin-bed structures in the subsurface formation to be identified, and in some instances, thicknesses of such structures to be determined.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.