Q-factor measurement
US10797535B2 · kind B2 · utility
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24Claims
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Assignee
Inventors
Key dates
| Filing date | Oct 8, 2018 |
| Grant date | Oct 6, 2020 |
| Priority date | — |
| Expiry date | Feb 17, 2039 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02B70/10
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
In accordance with some embodiments of the present invention, a method of determining a Q-factor in a transmit circuit with a resonant circuit includes setting a system voltage; performing a coarse scan to determine a course resonant frequency; performing a fine scan based on the course scan to determine a resonant frequency; performing a final measurement at the resonant frequency to determine an average system voltage and an average peak voltage of the resonant circuit; calculating a Q parameter from the average system voltage and the average peak voltage; and calculating the Q-factor from the Q parameter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.