Patent · US Active

Microlithographic fabrication of structures

US10802397B2 · kind B2 · utility

1Cited by
8References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 6, 2020
Grant dateOct 13, 2020
Priority date
Expiry dateMar 6, 2040

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/7035
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

Micro- and nano-patterns in imprint layers formed on a substrate and lithographic methods for forming such layers. The layers include a plurality of structures, and a residual layer having a residual layer thickness (RLT) that extends from the surface of the substrate to a base of the structures, where the RLT varies across the surface of the substrate according to a predefined pattern.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.