Non-volatile storage with wear-adjusted failure prediction
US10802911B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 21, 2018 |
| Grant date | Oct 13, 2020 |
| Priority date | — |
| Expiry date | May 3, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/0411
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A non-volatile storage apparatus includes a set of non-volatile memory cells and one or more control circuits in communication with the set of non-volatile memory cells. The one or more control circuits are configured to collect failure bit counts (FBCs) for data read from the set of non-volatile memory cells in a first time period and manage the set of non-volatile memory cells according to a probability of occurrence of a target FBC in a second time period that is subsequent to the first time period. The probability of occurrence of the target FBC during the second time period is calculated from a model of FBC distribution change of the set of non-volatile memory cells.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.