System and method for checking and characterizing snapshot metadata using snapshot metadata database
US10802927B2 · kind B2 · utility
2Cited by
3References
16Claims
0Family size
Assignee
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Key dates
| Filing date | Nov 17, 2016 |
| Grant date | Oct 13, 2020 |
| Priority date | — |
| Expiry date | Sep 15, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/815
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
System and method for checking and characterizing metadata of snapshots utilize a snapshot metadata database to execute at least one of checking and characterizing operations on the metadata of snapshots. The snapshot metadata database includes information extracted from backing storage elements containing the metadata of snapshots.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.