System and method for determining a trained neural network model for scattering correction
US10803555B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 23, 2018 |
| Grant date | Oct 13, 2020 |
| Priority date | — |
| Expiry date | Jul 30, 2038 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20084
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for generating a trained neural network model for scanning correction corresponding to one or more imaging parameters is provided. The trained neural network model may be trained using training data. The training data may include at least one first set of training data. The first set of training data may be generated according to a process for generating the first set of training data. The process may include obtaining a first image and a second image corresponding to the one or more imaging parameters. The second image may include less scattering noises than the first image. The process may further include determine the first set of training data based on the first image and the second image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.