Patent · US Active

Single particle analysis using optical detection

US10804091B2 · kind B2 · utility

0Cited by

1References

20Claims

0Family size

Assignee

PerkinElmer Health Sciences Canada, Inc. · CA

Inventors

Chady Stephan · Brampton, CA
Samad Bazargan · York, CA

Key dates

Filing date	Dec 4, 2018
Grant date	Oct 13, 2020
Priority date	—
Expiry date	Dec 4, 2038

Classification

Technology area (CPC H)Electricity
CPC primaryH01J49/167
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Methods and systems of identifying two or more elements in a single individual particle are described. In some examples, an optical emission from each of an ionized first element and an ionized second element can simultaneously be detected to identify at least a first element in a particle from a plurality of particles using the optical emission from the ionized first element, and to identify at least a second element in the particle from the plurality of particles using the optical emission from the second ionized element. The identified first element and the identified second element can be used to identify a source of the particle from a plurality of particles.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.